Mobile ions or ionic contamination in general have a negative impact on the reliability of microelectronic systems under certain environmental conditions. Especially when exposed to moisture, this can lead to the formation of electrolytic microcells. These ionic contaminations can diffuse from plastic housings and polymeric casting compounds / mold masses into the chip. The ensuing electrochemical reactions can lead to the formation of dendrites and failure of the components. For example, ions that have diffused into the surface can lead to the formation of tin or silver dendrites between tracks or bond points. The analysis of ionic contamination is therefore also a crucial process in the reliability and lifetime of chips and power modules.
SGS INSTITUT FRESENIUS has many years of experience in the development of methods for Reverse Engineering projects. In addition to standard-compliant leaching or rinsing of material surfaces (IPC-TM-650), we offer extraction methods for quantitative ion analysis adapted to the respective plastic. These methods were developed specifically as part of a joint project. It has been shown that our methods ensure a much more effective ion yield than the normative specifications, whereby the influence of mixture components on the ion yield can also be demonstrated. All common plastic variants can be analyzed as component or masterbatch in aqueous matrix, as well as soft-elastic silicone gels, casting compounds of varying cross-linking density, and their raw components.
SGS INSTITUT FRESENIUS GmbH is a partner in R&D joint projects. Work is funded under the current funding guidelines of the EU, the BMBF, and the State of Saxony.
SGS INSTITUT FRESENIUS GmbH
Königsbrücker Landstr. 161
t +49 351 8841-200